{"id":1381,"date":"2017-11-14T20:06:05","date_gmt":"2017-11-14T17:06:05","guid":{"rendered":"http:\/\/new.nanocraft.de\/?page_id=1381"},"modified":"2018-06-15T10:39:43","modified_gmt":"2018-06-15T08:39:43","slug":"analytics-measuring-surface","status":"publish","type":"page","link":"\/en\/analytics-measuring-surface\/","title":{"rendered":"Analytics Measuring surface"},"content":{"rendered":"<h1>Analytical Services Surface Technology<\/h1>\n<div id=\"block_content\">\n<div class=\"tb_image_r\">Due to our long-standing experience in the field of surface analysis, we can provide our customers with a wide range of analytical methods.<\/div>\n<\/div>\n<h2>Chemical Force Microscopy (CFM)<\/h2>\n<p>As experts and co-inventors (<a href=\"\/en\/publication\">publications<\/a>) in the field of chemical force microscopy (CFM), we are very pleased to be able to offer this service to our customers as a service as well.<\/p>\n<p>Using CFM, very specific interactions between specially coated tips (see <a href=\"\/en\/afm-tips\">CFM measurement tips<\/a>) and the surface to be examined can be detected. This results in a high chemical specificity of the image. Chemical sensitivity combined with topographic and elastic high resolution makes chemical force microscopy a unique tool for surface research with great potential for developments and new solutions.<\/p>\n<div id=\"block_content\">\n<h2>Modifications of Scanning Probe Microscopy<\/h2>\n<p>Besides CFM, NanoCraft Coating GmbH offers further modifications of scanning probe microscopy (SPM). These include:<\/p>\n<\/div>\n<ul>\n<li>Atomic force microscopy (scanning force microscopy, AFM)<\/li>\n<li>Piezoelectric force microscopy (PFM)<\/li>\n<li>Digital Pulsed Force Mode (DPFM) &#8211; SPM<\/li>\n<li>Tapping Mode Microscopy<\/li>\n<\/ul>\n<h2>further analytical methods from our service portfolio<\/h2>\n<div id=\"block_content\">\n<p>In addition to the analysis methods listed above, we also offer our customers the following service analytics:<\/p>\n<\/div>\n<ul>\n<li>Fourier transform infrared spectrometry (ATR-FTIR) for the detection of molecular bonds (e.g. C-H, -OH, C=O, -NH &#8230;) in 100 &#8211; 3000nm depth<\/li>\n<li>Secondary ion mass spectrometry (ToF-SIMS) imaging method for analyzing the atomic and molecular composition of vacuum &#8211; compatible samples in the upper 1-3 monolayers or for recording depth profiles.<\/li>\n<li>X-ray photoelectron spectroscopy (X-ray photoelectron spectroscopy, XPS; electron spectroscopy for chemical analysis, ESCA) &#8211; for non-destructive determination of the chemical composition of vacuum-compatible samples at 5 &#8211; 10 nm depth, optionally imaging<\/li>\n<li>Scanning electron microscope (SEM) for imaging the sample topography in the nm range for vacuum-compatible samples<\/li>\n<li>Transmission electron microscopy (TEM) for vacuum &#8211; compatible samples from 10 to several 100nm<\/li>\n<li>Ellipsometry &#8211; to determine dielectric material properties and layer thickness of thin layers by changing the polarization state of light<\/li>\n<li>Contact angle microscopy &#8211; for characterizing the wetting behavior of solid surfaces by liquids, hydrophilicity, hydrophobia, oleophobia<\/li>\n<\/ul>\n<p>NanoCraft Coating GmbH determines for you the critical parameters of your surface quickly and reliably such as: chemical elements, surface roughness and topography (down to the atomic range), interactive forces, surface energies and wetting properties . In the following, we present the results in the form you require.<\/p>\n<p>Comparative investigations (before-after observation) as well as high-resolution imaging of the surface down to the atomic range are part of our daily business. The evaluation, analysis and interpretation carried out by us can of course also be documented in a form ready for publication.<\/p>\n<p>Would you like more information? We are at your disposal for a consultation regarding your specific request. You can reach us by phone +49 7733 948445 or by e-mail at \u00a0<a href=\"mailto:analytics@nanocraft.de\">info@\u200bnanocraft.\u200bde<\/a>.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Analytical Services Surface Technology Due to our long-standing experience in the field of surface analysis, we can provide our customers with a wide range of analytical methods. Chemical Force Microscopy (CFM) As experts and co-inventors (publications) in the field of chemical force microscopy (CFM), we are very pleased to be able to offer this service [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v21.5 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>analytic service - CRO for AFM and CFM - surface - NanoCraft Coating<\/title>\n<meta name=\"description\" content=\"AFM | CFM | REM | analytics | service | microscopy | scan | nano | mikro | imaging methods | ducumentation | illustration | service provider | topography | interaction forces | surface energy | NanoCraft | \u260e +49 (0) 7733 948445\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/nanocraft.de\/analytikservice-messservice\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"analytic service - CRO for AFM and CFM - surface - NanoCraft Coating\" \/>\n<meta property=\"og:description\" content=\"AFM | CFM | REM | analytics | service | microscopy | scan | nano | mikro | imaging methods | ducumentation | illustration | service provider | topography | interaction forces | surface energy | NanoCraft | \u260e +49 (0) 7733 948445\" \/>\n<meta property=\"og:url\" content=\"https:\/\/nanocraft.de\/analytikservice-messservice\/\" \/>\n<meta property=\"og:site_name\" content=\"Nanocraft - exploring nanospace\" \/>\n<meta property=\"article:modified_time\" content=\"2018-06-15T08:39:43+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/nanocraft.de\/analytikservice-messservice\/\",\"url\":\"https:\/\/nanocraft.de\/analytikservice-messservice\/\",\"name\":\"analytic service - CRO for AFM and CFM - surface - NanoCraft Coating\",\"isPartOf\":{\"@id\":\"https:\/\/nanocraft.de\/#website\"},\"datePublished\":\"2017-11-14T17:06:05+00:00\",\"dateModified\":\"2018-06-15T08:39:43+00:00\",\"description\":\"AFM | CFM | REM | analytics | service | microscopy | scan | nano | mikro | imaging methods | ducumentation | illustration | service provider | topography | interaction forces | surface energy | NanoCraft | \u260e +49 (0) 7733 948445\",\"breadcrumb\":{\"@id\":\"https:\/\/nanocraft.de\/analytikservice-messservice\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/nanocraft.de\/analytikservice-messservice\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/nanocraft.de\/analytikservice-messservice\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/nanocraft.de\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Analytics Measuring surface\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/nanocraft.de\/#website\",\"url\":\"https:\/\/nanocraft.de\/\",\"name\":\"Nanocraft - exploring nanospace\",\"description\":\"\u00a0Ihr Forschungs- &amp; 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