{"id":2430,"date":"2018-06-22T12:10:20","date_gmt":"2018-06-22T10:10:20","guid":{"rendered":"https:\/\/nanocraft.de\/?page_id=2430"},"modified":"2018-06-22T12:15:02","modified_gmt":"2018-06-22T10:15:02","slug":"topography","status":"publish","type":"page","link":"\/en\/topography\/","title":{"rendered":"Topography"},"content":{"rendered":"

Roughness and Topography Analyses<\/h1>\n

By the use of AFM atomic force microscopy, even the most difficult surfaces in the \u00b5m and nm range can be imaged three-dimensionally topographically. You can then apply various analysis tools to these data sets, depending on the problem.<\/p>\n

Cross-section analyses<\/h2>\n

The topography data of AFM measurements allow freely selectable cross-sections, which can then be measured precisely depending on the problem. It is typically used to analyze structures in the nm and \u00b5m range.<\/p>\n

\"CFM,

Querschnittsanalyse einer Oberfl\u00e4che.<\/p><\/div>\n

Roughness analyses: Determination of RMS and Ra values<\/h2>\n

The topographic data sets of AFM measurements enable the determination of typical roughness values, such as mean standard deviation (RMS) and mean roughness (Ra), but also Fourier analyses (PSD, power spectral density), particle size measurements and others.<\/p>\n

\"\"

Bestimmung verschiedener Oberfl\u00e4chenparameter<\/p><\/div>\n

 <\/p>\n

If you are interested in determining these parameters, we will be happy to advise you. Simply contact us at\u00a0 info@nanocraft.de<\/a>.<\/p>\n

 <\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

Roughness and Topography Analyses By the use of AFM atomic force microscopy, even the most difficult surfaces in the \u00b5m and nm range can be imaged three-dimensionally topographically. You can then apply various analysis tools to these data sets, depending on the problem. Cross-section analyses The topography data of AFM measurements allow freely selectable cross-sections, […]<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"yoast_head":"\nTopography - Roughness - \u00b5 - nanoanalysis - Fourier analysis - Nanocraft<\/title>\n<meta name=\"description\" content=\"\u00b5 and nano topography | topography | roughness | \u00b5m | nm | cross section | RMS | Ra | analytics | Fourier analysis | CRO \u260e +49 (0) 7733 948445\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/nanocraft.de\/topograhpie\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Topography - Roughness - \u00b5 - nanoanalysis - Fourier analysis - Nanocraft\" \/>\n<meta property=\"og:description\" content=\"\u00b5 and nano topography | topography | roughness | \u00b5m | nm | cross section | RMS | Ra | analytics | Fourier analysis | CRO \u260e +49 (0) 7733 948445\" \/>\n<meta property=\"og:url\" content=\"https:\/\/nanocraft.de\/topograhpie\/\" \/>\n<meta property=\"og:site_name\" content=\"Nanocraft - 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